X-Ray diffraction studies of thallium selenate in the range of temperature between 305 and 12 K
Grunwald, Thomas, Hoffmann, Wolfgang, Seidel, PeterVolume:
55
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150198408015328
Date:
April, 1984
File:
PDF, 434 KB
english, 1984