Analogue memory and ballistic electron effects in metal-amorphous silicon structures
Hajto, J., Owen, A. E., Snell, A. J., Le Comber, P. G., Rose, M. J.Volume:
63
Language:
english
Journal:
Philosophical Magazine Part B
DOI:
10.1080/01418639108224451
Date:
January, 1991
File:
PDF, 1.39 MB
english, 1991