A Semi-Bayesian Method for Shewhart Individual Control Charts
Vermaat, M. B. Thijs, Does, Ronald J. M. M.Volume:
3
Language:
english
Journal:
Quality Technology & Quantitative Management
DOI:
10.1080/16843703.2006.11673104
Date:
January, 2006
File:
PDF, 639 KB
english, 2006