![](/img/cover-not-exists.png)
Electrical and band structural analyses of Ti 1− x Al x O y films grown by atomic layer deposition on p-type GaAs
An, Youngseo, Mahata, Chandreswar, Lee, Changmin, Choi, Sungho, Byun, Young-Chul, Kang, Yu-Seon, Lee, Taeyoon, Kim, Jiyoung, Cho, Mann-Ho, Kim, HyoungsubVolume:
48
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/48/41/415302
Date:
October, 2015
File:
PDF, 2.09 MB
english, 2015