Electrical properties and microstructural characterization...

Chinese Physics B 2015 / 12 Vol. 24; Iss. 12

Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC

Zhou, Tian-Yu, Liu, Xue-Chao, Huang, Wei, Zhuo, Shi-Yi, Zheng, Yan-Qing, Shi, Er-Wei
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Volume:
24
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/24/12/126801
Date:
December, 2015
File:
PDF, 2.15 MB
english, 2015
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