Quantifying hidden defect in multi-layered structures by...

Journal of Physics Conference Series 2005 / 01 Vol. 13

Quantifying hidden defect in multi-layered structures by using eddy current system combined with a scanner

Huang, Pingjie, Zhou, Zekui, Wu, Zhaotong
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Volume:
13
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/13/1/088
Date:
January, 2005
File:
PDF, 165 KB
english, 2005
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