Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM
Kashtiban, R J, Bangert, U, Crowe, I, Halsall, M P, Sherliker, B, Harvey, A J, Eccles, J, Knights, A P, Gwilliam, R, Gass, MVolume:
209
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/209/1/012043
Date:
February, 2010
File:
PDF, 1.38 MB
english, 2010