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Improved accuracy in nano beam electron diffraction
Béché, A, Clément, L, Rouvière, J-LVolume:
209
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/209/1/012063
Date:
February, 2010
File:
PDF, 2.33 MB
english, 2010