Novel approach to material evaluation of thin surface...

Journal of Physics Conference Series 2010 / 03 Vol. 214

Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy

Landa, Michal, Růžek, Michal, Sedlák, Petr, Seiner, Hanuš, Bodnárová, Lucie, Zídek, Jan
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Volume:
214
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/214/1/012045
Date:
March, 2010
File:
PDF, 1.21 MB
english, 2010
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