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He implantation induced defects in InN
Linez, F, Ritt, M, Rauch, C, Kilanski, L, Choi, S, Räisänen, J, Speck, J S, Tuomisto, FVolume:
505
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/505/1/012012
Date:
April, 2014
File:
PDF, 1.30 MB
english, 2014