Reconstruction of crack profile using fuzzy logic
Sikora, Ryszard, Baniukiewicz, PiotrVolume:
25
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/03321640610666772
Date:
July, 2006
File:
PDF, 325 KB
english, 2006