[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China...

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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Generation for Timing-Critical Transition Faults

Lin, Xijiang, Kassab, Mark, Rajski, Janusz
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Year:
2007
Language:
english
DOI:
10.1109/ats.2007.4388063
File:
PDF, 321 KB
english, 2007
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