[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Investigation of forming process for metal oxide-based resistive switching memory by stochastic simulation
Huang, Peng, Liu, Xiaoyan, Zhao, Yudi, Chen, Bing, Gao, Bin, Du, Gang, Kang, JinfengYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021529
File:
PDF, 671 KB
english, 2014