[IEEE 2006 Sixth IEEE Conference on Nanotechnology - Cincinnati, OH, USA (17-20 June 2006)] 2006 Sixth IEEE Conference on Nanotechnology - A study of the self-assembled mono-layer deposition process for the anti-adhesion of nano-imprint stamps
Kuan-Wei Chen,, Hung-Yi Lin,, Fuh-Yu Chang,, Shuo-Hung Chan,, Tung-Chuan Wu,, Jen-Fin Lin,Volume:
2
Year:
2006
Language:
english
DOI:
10.1109/nano.2006.1717172
File:
PDF, 2.14 MB
english, 2006