[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Opportunities in System testing
Bahulkar, Arun, Kelkar, RahulYear:
2007
Language:
english
DOI:
10.1109/taicpart.2007.4344108
File:
PDF, 255 KB
english, 2007