SPIE Proceedings [SPIE Optical Systems Design '92 - Berlin, Germany (Tuesday 1 September 1992)] Thin Films for Optical Systems - Ellipsometric analysis of quadrilayer magneto-optic recording media
Siroky, Petr, Hrdina, Jiri, Atkinson, Ron, Jastrabik, Lubomir, Perina, Vratislav, Guenther, Karl H.Volume:
1782
Year:
1993
Language:
english
DOI:
10.1117/12.141026
File:
PDF, 149 KB
english, 1993