SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Charge-Coupled Devices and Solid State Optical Sensors III - Results from proton damage tests on the Michelson Doppler Imager CCD for SOHO
Zayer, Igor, Chapman, Ira, Duncan, Dexter W., Kelly, G. A., Mitchell, Keith E., Blouke, Morley M.Volume:
1900
Year:
1993
Language:
english
DOI:
10.1117/12.148604
File:
PDF, 352 KB
english, 1993