SPIE Proceedings [SPIE SPIE'S 1993 Symposium on...

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SPIE Proceedings [SPIE SPIE'S 1993 Symposium on Microlithography - San Jose, CA (Sunday 28 February 1993)] Advances in Resist Technology and Processing X - Comparison of liquid- and vapor-phase silylation processes for 193-nm positive-tone lithography

Hartney, Mark A., Kunz, Roderick R., Eriksen, Lynn M., LaTulipe, Douglas C., Hinsberg, William D.
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Volume:
1925
Year:
1993
Language:
english
DOI:
10.1117/12.154761
File:
PDF, 507 KB
english, 1993
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