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SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies
Search, David J., Hobson, Clifford A., Atkinson, John T., Pearson, Jeremy D., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171222
File:
PDF, 250 KB
english, 1994