SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Identification of quality of coal using an automated image analysis system
Dehmeshki, Jamshid, Daemi, Mohammad F., Miles, N. J., Atkin, B. P., Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232247
File:
PDF, 1.27 MB
english, 1996