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SPIE Proceedings [SPIE Fourth International Symposium on Optical Storage - Shenzhen, Guangdong Province, China (Monday 22 April 1996)] Fourth International Symposium on Optical Storage (ISOS '96) - Measurement of stress birefringence in optical disk substrates
Li, Xishan, Xu, Wendong, Zhu, Li, Gan, FuxiVolume:
2931
Year:
1996
Language:
english
DOI:
10.1117/12.248714
File:
PDF, 207 KB
english, 1996