SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Mathematical model for optoelectronic detection of the property of common axis of active-following axles
Ye, Jiaxiong, Fang, Youbin, Guan, Rongfeng, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253009
File:
PDF, 319 KB
english, 1996