SPIE Proceedings [SPIE Nondestructive Evaluation Techniques for Aging Infrastructure and Manufacturing - Scottsdale, AZ (Tuesday 3 December 1996)] Nondestructive Evaluation for Process Control in Manufacturing - Eddy current sensing of vertical Bridgman semiconductor crystal growth
Choi, Bill W., Dharmasena, Kumar P., Wadley, Haydn N. G., Bossi, Richard H., Moran, TomVolume:
2948
Year:
1996
Language:
english
DOI:
10.1117/12.259188
File:
PDF, 636 KB
english, 1996