SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Micromachining and Imaging - Atomic force microscopy using small cantilevers
Walters, Deron A., Viani, Mario, Paloczi, George T., Schaeffer, Tilman E., Cleveland, Jason P., Wendman, Mark A., Gurley, Gus, Elings, Virgil B., Hansma, Paul K., Michalske, Terry A., Wendman, Mark A.Volume:
3009
Year:
1997
Language:
english
DOI:
10.1117/12.271227
File:
PDF, 315 KB
english, 1997