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SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Real-time holographic nondestructive inspection system with automatic defect classification
Chen, Helen H., Aye, Tin M., Kim, Dai Hyun, Latchinian, Jack A., Brown, Vernon A., Kostrzewski, Andrew A., Savant, Gajendra D., Jannson, Tomasz P., Pergantis, Charles G., Rao, A. Ravishankar, Chang, NVolume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271244
File:
PDF, 588 KB
english, 1997