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SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Object recognition algorithm based on inexact graph matching and its application in a color vision system for recognition of electronic components on PCBs
Kroupnova, Natalia H., Korsten, Maarten J., Rao, A. Ravishankar, Chang, Ning S.Volume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271246
File:
PDF, 579 KB
english, 1997