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SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Automated Optical Inspection for Industry: Theory, Technology, and Applications II - Development of infrared nondestructive testing system with laser scanning automatic heat loading
Bai, Fengming, Liu, Weina, Ma, Li, Chen, Ling, Ma, Qianli, Ye, ShenghuaVolume:
3558
Year:
1998
Language:
english
DOI:
10.1117/12.318434
File:
PDF, 231 KB
english, 1998