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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Illumination and Source Engineering - New tool for determining diode laser beam intensity profiles in military weapon simulators
Arnold, Jack L., Solinsky, James C., Arecchi, Angelo V.Volume:
3428
Year:
1998
Language:
english
DOI:
10.1117/12.327959
File:
PDF, 4.37 MB
english, 1998