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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Optics, Instruments, and Missions - Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF
Allen, Christopher L., Plucinsky, Paul P., McNamara, Brian R., Edgar, Richard J., Schulz, Norbert S., Woo, Jonathan W., Hoover, Richard B., Walker II, Arthur B. C.Volume:
3444
Year:
1998
Language:
english
DOI:
10.1117/12.331237
File:
PDF, 1.55 MB
english, 1998