SPIE Proceedings [SPIE BiOS '99 International Biomedical Optics Symposium - San Jose, CA (Saturday 23 January 1999)] Lasers in Dentistry V - Depth profile analysis of the chemical and morphological changes in CO2-laser-irradiated dental enamel
Zuerlein, Michael J., Fried, Daniel, Featherstone, John D. B., Featherstone, John D. B., Rechmann, Peter, Fried, DanielVolume:
3593
Year:
1999
Language:
english
DOI:
10.1117/12.348350
File:
PDF, 1.62 MB
english, 1999