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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Radar Processing, Technology, and Applications IV - Comparison of high-resolution ISAR imagery from measured data and synthetic signatures
Li, Junfei, Wang, Yuanxun, Bhalla, Rajan, Ling, Hao, Chen, Victor C., Miceli, William J.Volume:
3810
Year:
1999
Language:
english
DOI:
10.1117/12.364077
File:
PDF, 976 KB
english, 1999