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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III - Development of a photon-counting capability for the electron-bombarded far-UV image sensor
Jenkins, Edward B., Reale, Michael A., Zucchino, Paul M., Fineschi, Silvano, Woodgate, Bruce E., Kimble, Randy A.Volume:
3764
Year:
1999
Language:
english
DOI:
10.1117/12.371086
File:
PDF, 894 KB
english, 1999