SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Novel object detection method by probability velocity field
Cao, Yulong, Yang, Jingyu, Ren, Mingwu, Yang, Wen Jie, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380085
File:
PDF, 1.18 MB
english, 2000