SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Polarization Analysis, Measurement, and Remote Sensing III - High-order birefringence measurement using spectroscopic polarized light
Kowa, Hiroyuki, Muraki, Kanae, Otani, Yukitoshi, Umeda, Norihiro, Yoshizawa, Toru, Chenault, David B., Duggin, Michael J., Egan, Walter G., Goldstein, Dennis H.Volume:
4133
Year:
2000
Language:
english
DOI:
10.1117/12.406620
File:
PDF, 152 KB
english, 2000