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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Three-dimensional shape measurement in neurovision system
Xiong, Yingen, Hu, Haifeng, Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417196
File:
PDF, 716 KB
english, 2001