SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Optoelectronic computer-aided systems for three-dimensional inspection of complex objects
Galiulin, Ravil M., Ilyasov, Barry G., Galiulin, Rishat M., Bakirov, J. M., Bogdanov, D. R., Tumashinov, A. V., Petrov, S. V., Yudin, A. A., Vorontsov, A. V., Ponomarenko, I. V., Harding, Kevin G., MiVolume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417208
File:
PDF, 488 KB
english, 2001
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