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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Color-based localization of patterns through distortion tolerant graph matching
Poelzleitner, Wolfgang, Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417212
File:
PDF, 1.54 MB
english, 2001