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SPIE Proceedings [SPIE Fifth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 22 May 2000)] Fifth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Gap deep defect states in narrow-gap semiconductors
Sizov, Fiodor F., Darchuk, Sergey D., Golenkov, Alexandr G., Sizov, Fiodor F.Volume:
4355
Year:
2001
Language:
english
DOI:
10.1117/12.417783
File:
PDF, 168 KB
english, 2001