SPIE Proceedings [SPIE Lasers in Metrology and Art...

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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Realizing traceability to the SI in dimensional metrology: today and in the future

Kunzmann, Horst, Jaeger, Frank, Fluegge, Jens, Decker, Jennifer E., Brown, Nicholas
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Volume:
4401
Year:
2001
Language:
english
DOI:
10.1117/12.445627
File:
PDF, 731 KB
english, 2001
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