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SPIE Proceedings [SPIE Boston - DL tentative - Boston, MA (Tuesday 25 September 1990)] Microelectronic Interconnects and Packages: System and Process Integration - Methods for comparative analysis of waveform degradation in electrical and optical high-performance interconnections
Merkelo, Henri, McCredie, B. D., Veatch, M. S., Quinn, D. L., Dorneich, M., Doi, Yutaka, Tewksbury, Stuart K., Carruthers, John R.Volume:
1390
Year:
1991
Language:
english
DOI:
10.1117/12.47727
File:
PDF, 3.71 MB
english, 1991