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SPIE Proceedings [SPIE High-Power Lasers and Applications - San Jose, CA (Saturday 25 January 2003)] Photon Processing in Microelectronics and Photonics II - Surface analysis by laser-induced desorption time-of-flight mass spectrometry
Allen, Susan D., Fu, Jinmei, Surapaneni, Yamini, Hopkins, Adam J., Davis, Phillip, Pique, Alberto, Sugioka, Koji, Herman, Peter R., Fieret, Jim, Bachmann, Friedrich G., Dubowski, Jan J., Hoving, WilleVolume:
4977
Year:
2003
Language:
english
DOI:
10.1117/12.479418
File:
PDF, 244 KB
english, 2003