SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Double-diode configuration of self-calibrating photodiodes
Guryev, Mykola, Duparre, Angela, Singh, Bhanwar, Kupko, Alexander, Nazarenko, LeonidVolume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.504089
File:
PDF, 88 KB
english, 2003