SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Information reconstruction based on phase-shifting technique in digital holography
Jiao, Yunfang, Duparre, Angela, Singh, Bhanwar, Yu, Yingjie, Lu, ZhiwenVolume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.505450
File:
PDF, 138 KB
english, 2003