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SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection - Synchronous phase-extraction technique and its applications
Hung, Y.Y., Tang, Shouhong, Jin, Guofan, Zhu, Quiming, Grover, Chander P.Volume:
1332
Year:
1991
Language:
english
DOI:
10.1117/12.51124
File:
PDF, 532 KB
english, 1991