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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Image Processing: Algorithms and Systems III - Histogram as a measure of shape matching
Chang, Min Hyuk, Dougherty, Edward R., Astola, Jaakko T., Seo, Kyung-Sik, Park, Hye-Jin, Egiazarian, Karen O., Park, Jong-AnVolume:
5298
Year:
2004
Language:
english
DOI:
10.1117/12.521596
File:
PDF, 87 KB
english, 2004