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SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Perth, Australia (Tuesday 9 December 2003)] Microelectronics: Design, Technology, and Packaging - 2D scanning Rotman lens structure for smart collision avoidance sensors
Abbott, Derek, Hall, Leonard T., Hansen, Hedley J., Eshraghian, Kamran, Musca, Charles A., Abbott, Derek, Pavlidis, Dimitris, Weste, NeilVolume:
5274
Year:
2003
Language:
english
DOI:
10.1117/12.527948
File:
PDF, 815 KB
english, 2003