SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Perth, Australia (Tuesday 9 December 2003)] Microelectronics: Design, Technology, and Packaging - Gate-leakage-tolerant circuits in deep sub-100-nm CMOS technologies
Abbott, Derek, Kang, Sung-Mo, Yang, Ge, Eshraghian, Kamran, Musca, Charles A., Wang, Zhongda, Pavlidis, Dimitris, Weste, NeilVolume:
5274
Year:
2003
Language:
english
DOI:
10.1117/12.530278
File:
PDF, 173 KB
english, 2003