SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - High-resolution nondestructive evaluation at the Center for Materials Diagnosis
Meyendorf, Norbert, Meyendorf, Norbert, Baaklini, George Y., Sathish, Shamachary, Druffner, Carl J., Michel, Bernd, Blackshire, James L., Hoffmann, Jochen P., Zhan, Qiwen, Andrews, Robert J.Volume:
5392
Year:
2004
Language:
english
DOI:
10.1117/12.541351
File:
PDF, 403 KB
english, 2004