SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Aberration characterization using frequency domain analysis of low-coherence interferograms
Colonna de Lega, Xavier, Creath, Katherine, Schmit, JoannaVolume:
5531
Year:
2004
Language:
english
DOI:
10.1117/12.559843
File:
PDF, 309 KB
english, 2004