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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Materials and Devices for Sensing and Imaging II - Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity
Wang, Anbo, Li, Jinhuan, Sasaki, Osami, Zhang, Yimo, Ishii, Yukihiro, Suzuki, TakamasaVolume:
5633
Year:
2004
Language:
english
DOI:
10.1117/12.576666
File:
PDF, 242 KB
english, 2004